RARE-EARTH MATERIALS, SCINTILLATOR CRYSTALS AND RUGGEDIZED SCINTILLATOR DEVICES INCORPORATING SUCH

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A rare-earth halide material comprising a first surface region having a first surface roughness (Rrms1) and a second surface region having a second surface roughness (Rrms2), wherein the first surface roughness value is at least about 10% less than the second surface roughness value, wherein surface roughness is measured using scanning white light interferometry over an area of 1 mm2.