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The dielectric ceramic has a composition represented by general formula 100(Ba1-x-ySrxCay)m(Ti1-zZrz)O3+aBaO+bR2O3+cMgO+dMnO+eCuO+fV2O5+gXuOv (where R is a rare-earth element such as La, Ce or Pr; and XuOv is an oxide group including at least Si); and 0<=x<=0.05, 0<=y<=0.08 (preferably 0.02<=y<=0.08), 0<=z<=0.05, 0.990<=m, 100.2<=(100 m+a)<=102, 0.05<=b<=0.5, 0.05<=c<=2, 0.05<=d<=1.3, 0.1<=e<=1.0, 0.02<=f<=0.15, and 0.2<=g<=2. With this composition, a monolithic ceramic capacitor retaining good dielectric characteristics and temperature characteristics even if a high field strength voltage is applied by further thinning the dielectric layers thereof and having excellent reliability achieving good isolating property, dielectric strength, and high-temperature load life is obtained.