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ANALYTICAL APPARATUS FOR DETECTING AT LEAST ONE ANALYTE IN A SAMPLE 发明授权

2023-05-22 4290 598K 0

专利信息

申请日期 2025-07-07 申请号 KR1020147012868
公开(公告)号 KR101669739B1 公开(公告)日 2016-10-27
公开国别 KR 申请人省市代码 全国
申请人 에프 호프만 라 로슈 아게
简介 Analytical apparatuses are disclosed for detecting at least one analyte in a sample, where in an analyte measurement at least an electrical or optical property changeable by presence of the analyte at least one test chemical of a test element is recorded, and where the analytical apparatus also can perform at least one quality measurement on the at least one test chemical such as an intrinsic luminescence, which is recorded and from the intrinsic luminescence a conclusion is drawn on a quality of the test chemical and thus the test element. Methods also are disclosed for detecting at least one analyte in a sample that include a quality measurement of the at least one test chemical of the test strip.


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