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Salt, acid generator, resist composition and a manufacturing method of a resist pattern 发明授权

2023-11-21 1820 761K 0

专利信息

申请日期 2026-04-23 申请号 JP2012257627
公开(公告)号 JP5972765B2 公开(公告)日 2016-08-17
公开国别 JP 申请人省市代码 全国
申请人 住友化学株式会社
简介 PROBLEM TO BE SOLVED : To provide a salt to be used for a resist composition from which a negative resist pattern with excellent resolution and/or CD uniformity (CDU) can be produced.SOLUTION : The salt is expressed by formula (I). In formula (I), Qand Qeach independently represent a fluorine atom or a perfluoroalkyl group having 1 to 6 carbon atoms; Lrepresents a divalent saturated hydrocarbon group having 1 to 17 carbon atoms, in which a methylene group included in the saturated hydrocarbon group may be replaced by an oxygen atom or a carbonyl group, and a hydrogen atom included in the saturated hydrocarbon group may be replaced by a fluorine atom; Rand Reach independently represent an aliphatic hydrocarbon group having 1 to 6 carbon atoms, or Rand Rare bonded to each other together with a carbon atom bonded to both to form a ring having 5 to 20 carbon atoms; the aliphatic hydrocarbon group and the ring may have a substituent; and Zrepresents an organic cation.


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