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Semiconductor manufacturing equipment with trace elements for improved defect tracing and methods of 发明授权

2023-09-08 2090 654K 0

专利信息

申请日期 2026-03-11 申请号 US13735866
公开(公告)号 US9385018B2 公开(公告)日 2016-07-05
公开国别 US 申请人省市代码 全国
申请人 Samsung Austin Semiconductor; Samsung Electronics Co Ltd
简介 A semiconductor manufacturing equipment comprising trace elements and method of manufacture are disclosed. The semiconductor manufacturing equipment includes one or more components, wherein at least one component is made from an alloy comprising one or more materials and one or more rare earth elements (REEs). The alloy comprises predetermined quantities of the respective REEs. The method for manufacturing a component includes forming an alloy comprising at least one material and one or more selected rare earth elements (REEs) and building the component with the alloy.


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