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MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE 发明申请

2023-03-30 3620 188K 0

专利信息

申请日期 2025-06-25 申请号 JP2015126250
公开(公告)号 JP2015213181A 公开(公告)日 2015-11-26
公开国别 JP 申请人省市代码 全国
申请人 SEMICONDUCTOR ENERGY LAB CO LTD
简介 PROBLEM TO BE SOLVED : To impart stable electric characteristics to a semiconductor device using an oxide semiconductor to achieve higher reliability. SOLUTION : A manufacturing process for a transistor including an oxide semiconductor film includes : an implantation step of implanting rare gas ions into at least the oxide semiconductor film; and a heating step of heating the oxide semiconductor film with the rare gas ions implanted, under reduced pressure, under a nitrogen atmosphere, or under a rare gas atmosphere. Thus, hydrogen or water contained in the oxide semiconductor film with the rare gas ions implanted is released, thereby purifying the oxide semiconductor film. COPYRIGHT : (C)2016, JPO&INPIT


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