客服热线:18202992950

CRYSTALLINE MATERIAL, RADIATION DETECTOR, IMAGE PICK-UP DEVICE, NON-DESTRUCTIVE INSPECTION DEVICE 发明申请

2023-10-02 3850 1716K 0

专利信息

申请日期 2025-07-09 申请号 EP13869111
公开(公告)号 EP2940195A1 公开(公告)日 2015-11-04
公开国别 EP 申请人省市代码 全国
申请人 Tohoku University
简介 Disclosed is a crystal material represented by a general formula (1) : (Gd1-x-y-zLaxMEyREz)2 (Si1-vMMv)2O7 (1), where ME is at least one selected from Y, Yb, Sc, and Lu; RE is a transition metal or rare earth element; MM is at least one selected from Ge, Sn, Hf, and Zr; and ranges of x, y, z, and v are represented by the following (i) or (ii) : (i) 0.05 ≤ x + z ≤ 1.0, 0.0 ≤ y ≤ 1.0, 0.0001 ≤ z < 0.05, and v = 0.0 (where, when RE is Ce, y = 0 is an exception) or (ii) 0.0 ≤ x + y + z ≤ 1.0, 0.0001 ≤ z ≤ 0.05, and 0.0 < v. This configuration provides a crystal material having a large light emission amount and a short fluorescence lifetime and a radiation detector, an imaging apparatus, a nondestructive inspection apparatus, and a lighting apparatus containing the crystal material.


您还没有登录,请登录后查看下载地址


反对 0举报 0 收藏 0 打赏 0评论 0
下载排行
网站首页  |  关于我们  |  联系方式  |  使用协议  |  版权隐私  |  网站地图  |  排名推广  |  广告服务  |  积分换礼  |  网站留言  |  RSS订阅  |  违规举报  |  京ICP备2021025988号-4