客服热线:18202992950

METHOD FOR ETCHING FILM HAVING TRANSITION METAL 发明授权

2023-03-23 1380 1143K 0

专利信息

申请日期 2025-07-01 申请号 KR1020140035471
公开(公告)号 KR101567199B1 公开(公告)日 2015-11-02
公开国别 KR 申请人省市代码 全国
申请人 TOKYO ELECTRON LIMITED; TOHOKU UNIVERSITY
简介 Substrate processing device are generated by using a method for etching film including metal is provided. Substrate processing device a, in said chamber and in a plasma generating chamber heat treatment vessel and a second surface opposing the first surface, of plasma generating process chamber is disposed between, to establish communication between the chamber plasma generating process chamber a plurality of openings, having shielding to ultraviolet light of wet liquid to flow down shields. The method is, (a) plasma generating chamber number 1 containing oxygen by generating plasma, with photoresist layer formed said storing the treated air from a process chamber to, oxygen atoms of neutral particles and a step of supplying inside the, (b) said treating chamber, complex the transition metal oxide for gas and a step of supplying inside the number 2, (c) said plasma generating chamber coupled to an upper surface plasma rare gas, said neutral particles atoms of the rare gas treating chamber includes a step of supplying inside the processing.


您还没有登录,请登录后查看下载地址


反对 0举报 0 收藏 0 打赏 0评论 0
下载排行
网站首页  |  关于我们  |  联系方式  |  使用协议  |  版权隐私  |  网站地图  |  排名推广  |  广告服务  |  积分换礼  |  网站留言  |  RSS订阅  |  违规举报  |  京ICP备2021025988号-4