| 简介 |
The present invention refers to a novel hybrid device, which is best known as fluorine reflectometer, intended to measure the radiation of materials doped with optically active atoms, such as the rare earth elements. Said device is operated in two modes : in the XL-?mode, the instrument will measure the luminescence and excitation spectrum of the sample. In the RT-? Mode, the instrument will measure the specular reflection spectrum and the spectrum of transmission of slim or thick layers. A photomultiplier (photodiode enlarged in UV) is used when the XL-? (RT-?) mode is operated. The angle of incidence of the sample and the angle of the detected emission may be changed in both modes; the first is manually changed and the second automatically changed. The sensitivity of the instrument allows the luminosity of thin layers with thicknesses of 3 um to be measured, in this case the signal slightly surpassing the noise. |
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