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METHOD FOR ETCHING FILM CONTAINING COBALT AND PALLADIUM 发明申请

2023-01-30 3530 150K 0

专利信息

申请日期 2025-06-25 申请号 JP2013056584
公开(公告)号 JP2014183184A 公开(公告)日 2014-09-29
公开国别 JP 申请人省市代码 全国
申请人 TOKYO ELECTRON LTD
简介 PROBLEM TO BE SOLVED : To provide a method for etching a film containing cobalt and palladium in manufacturing an electronic device. SOLUTION : A method for etching a film containing cobalt and palladium comprises : the step "a" for etching a film containing cobalt and palladium, which is an object to be processed, by an ion-sputtering etching method; the step "b" for exposing the object to be processed to plasma of a first gas containing elemental halogen; the step "c" for exposing the object to be processed to plasma of a second gas containing carbon; and the step "d" for exposing the object to be processed to plasma of a third gas containing inert gas. In the steps "a", "b", and "c", the temperature of a setting table to put thereon the object to be processed is set to a first temperature of 10°C or below. In the step "d", the temperature of the setting table to put thereon the object to be processed is set to a second temperature higher than the first temperature. COPYRIGHT : (C)2014, JPO&INPIT


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