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A film forming method and device 发明授权

2023-05-14 2970 164K 0

专利信息

申请日期 2025-09-15 申请号 JP2010217895
公开(公告)号 JP5392215B2 公开(公告)日 2014-01-22
公开国别 JP 申请人省市代码 全国
申请人 Tokyo Electron Ltd219967
简介 A film forming method which generates metal ions from a metal target with a plasma in a processing chamber and attracts the metal ions with a bias to deposit a metal thin film on a target object wherein trenches are formed. The method includes : generating metal ions from a target and attracting the metal ions into a target object with a bias to form a base film in a trench; ionizing a rare gas with the bias in a state where no metal ion is generated and attracting the generated ions into the target object to etch the base film; and plasma sputtering the target to generate metal ions and attracting the metal ions into the object with a high frequency power for bias to deposit a main film as a metal film, while reflowing the main film by heating.


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