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Semiconductor structure and method for forming the same 发明授权

2023-03-02 4320 893K 0

专利信息

申请日期 2025-06-26 申请号 US13576937
公开(公告)号 US8546857B1 公开(公告)日 2013-10-01
公开国别 US 申请人省市代码 全国
申请人 Jing Wang; Lei Guo; Wei Wang
简介 A semiconductor structure and a method for forming the same are provided. The semiconductor structure comprises : a semiconductor substrate; a source region and a drain region defined in the semiconductor substrate respectively, and a trench formed in the source region and/or the drain region, in which a rare earth oxide layer is formed in the trench; a source and/or a drain formed on the rare earth oxide layer; and a channel region formed between the source and the drain. A relationship between a lattice constant a of the rare earth oxide layer and a lattice constant b of a semiconductor material of the source and/or the drain and/or the channel region is a=(n±c)b, where n is an integer, c is a mismatch ratio of lattice constants, and 0


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