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Modification of REO by subsequent III-N EPI process 发明授权

2023-07-16 5120 413K 0

专利信息

申请日期 2025-08-14 申请号 US13631906
公开(公告)号 US8501635B1 公开(公告)日 2013-08-06
公开国别 US 申请人省市代码 全国
申请人 Andrew Clark; Robin Smith; Rytis Dargis; Erdem Arkun; Michael Lebby
简介 A method of growing single crystal III-N material on a semiconductor substrate includes providing a substrate including one of crystalline silicon or germanium and a layer of rare earth oxide. A layer of single crystal III-N material is epitaxially grown on the substrate using a process that elevates the temperature of the layer of rare earth oxide into a range of approximately 750° C. to approximately 1250° C. in the presence of an N or a III containing species, whereby a portion of the layer of rare earth oxide is transformed to a new alloy.


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