| 简介 |
PROBLEM TO BE SOLVED : To provide a method and a device for inspecting characteristics of a superconductive wire material capable of measuring characteristics in a short time.
SOLUTION : Correlation data of the distribution of a critical current density in the width direction of a superconductive wire material and the energization loss of the superconductive wire material is obtained in advance. The energization loss of the superconductive wire material, which is a measuring object, is measured and the distribution of the critical current density of the wire material, which is a measuring object, is obtained by referring the measured energization loss to the correlation data. A thin film wire material 10 in which a superconductivity phase thin film 110 composed of an oxide including rare earth elements is deposited on a substrate 150 is cited for the measuring object. Since energization loss can be measured in a relatively short time, by measuring the energization loss of the thin film wire material 10 and utilizing the correlation data, the distribution of a critical current density in the width direction in the thin film wire material 10 can be obtained in a short time.
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