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Measuring device, measuring method, and program 发明申请

2023-07-25 3520 411K 0

专利信息

申请日期 2025-06-28 申请号 JP2011020786
公开(公告)号 JP2012157624A 公开(公告)日 2012-08-23
公开国别 JP 申请人省市代码 全国
申请人 TOPCON CORP
简介 PROBLEM TO BE SOLVED : To acquire a position without performing a repeated photographing when the position of a part of a measuring terminal cannot be acquired in a technique to acquire the positions of two or more measuring terminals that are made to contact or adjoin an object based on a photographic image. SOLUTION : As for probe sockets 11 and 12, plurals are disposed at a head 25 of a subject. The condition that disposes the probe sockets at the subject is shot from two or more directions, and the positions of the probe sockets are detected from the photographic image. In this case, a re-detection is performed by using the photographic image of the probe socket that is reflected in other photographic images when the detection from a certain specific photographic image does not go well, and a part of the probe socket positions cannot be specified. As a result, it ends without performing a repeated photographing even if there is a detection mistake. COPYRIGHT : (C)2012, JPO&INPIT


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