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METHOD FOR FORMING BARRIER LAYER 发明申请

2023-08-02 3120 69K 0

专利信息

申请日期 2025-07-08 申请号 JP2010285943
公开(公告)号 JP2012132074A 公开(公告)日 2012-07-12
公开国别 JP 申请人省市代码 全国
申请人 ULVAC CORP
简介 PROBLEM TO BE SOLVED : To provide a method for forming a barrier layer, by which a barrier layer exhibiting sufficient barrier performance can be formed with satisfactory productivity even when the barrier layer is interposed between conductive layers comprising dissimilar metals. SOLUTION : The method for forming a barrier layer BM includes the steps of : arranging a work piece W with one conductive layer CL1 and a target 2, for example made of Ti, inside a vacuum processing chamber 1a, introducing rare gas in the vacuum processing chamber to form a plasma atmosphere, and sputtering the target to form a first metal layer on a surface of the one conductive layer; introducing gas containing oxygen gas and nitrogen gas in the vacuum processing chamber to form a plasma atmosphere and oxynitriding a surface of the first metal layer while also exposing the target to the plasma atmosphere so that a surface of the target is oxynitrided; and further introducing the rare gas in the vacuum processing chamber to form a plasma atmosphere and sputtering the target to form a second metal layer on the oxynitrided surface. COPYRIGHT : (C)2012, JPO&INPIT


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