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FILM FORMING METHOD OF SILICON OXIDE FILM, SILICON OXIDE FILM, SEMICONDUCTOR DEVICE, MANUFACTURIN 发明授权

2023-07-30 2210 577K 0

专利信息

申请日期 2025-06-25 申请号 KR1020107023086
公开(公告)号 KR101147920B1 公开(公告)日 2012-05-15
公开国别 KR 申请人省市代码 全国
申请人 TOKYO EREGUTORON COMPANY; TOKYO ELECTRON LIMITED
简介 A silicon compound gas, an oxidizing gas, and a rare gas are supplied into a chamber (2) of a plasma processing apparatus (1). A microwave is supplied into the chamber (2), and a silicon oxide film is formed on a target substrate with plasma generated by the microwave. A partial pressure ratio of the rare gas is 10% or more of a total gas pressure of the silicon compound gas, the oxidizing gas, and the rare gas, and an effective flow ratio of the silicon compound gas and the oxidizing gas (oxidizing gas/silicon compound gas) is not less than 3 but not more than 11.


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