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IIIOxNy ON REO/Si 发明申请

2023-11-25 1190 402K 0

专利信息

申请日期 2025-06-27 申请号 US13208371
公开(公告)号 US20120104567A1 公开(公告)日 2012-05-03
公开国别 US 申请人省市代码 全国
申请人 CLARK ANDREW; ARKUN ERDEM; LEBBY MICHAEL
简介 An insulative layer on a semiconductor substrate and a method of fabricating the structure includes the steps of depositing a single crystal layer of rare earth oxide on a semiconductor substrate to provide electrical insulation and thermal management. The rare earth oxide is crystal lattice matched to the substrate. A layer of single crystal IIIOxNy is formed in overlying relationship on the rare earth oxide by transitioning from the layer of rare earth oxide to a single crystal layer of IIIOxNy within a one wafer single epitaxial process. In the preferred embodiment the substrate is silicon, the rare earth oxide is Gd2O3, and the IIIOxNy includes AlOxNy.


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