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METHOD OF MANUFACTURING GaN-BASED SEMICONDUCTOR EPITAXIAL SUBSTRATE 发明申请

2023-12-20 2260 64K 0

专利信息

申请日期 2025-06-25 申请号 JP2010081045
公开(公告)号 JP2011216548A 公开(公告)日 2011-10-27
公开国别 JP 申请人省市代码 全国
申请人 JX NIPPON MINING METALS CORP
简介 PROBLEM TO BE SOLVED : To provide a method of manufacturing a GaN-based semiconductor epitaxial substrate, in which a warp-free crystalline GaN-based semiconductor is epitaxially grown. SOLUTION : A low-temperature protective layer 12 consisting of AlN is grown on a rare earth perovskite substrate 11 and a first AlGaN-based semiconductor layer having Alx1Ga1-x1N where composition x1 of Al satisfies 0.40≤x1≤0.45 is grown on the low-temperature protective layer 12. Then, a growth layer following a second AlGaN semiconductor layer having Alx2Ga1-x2N where composition x2 of Al satisfies 0≤x2≤0.45 is laminated on the first AlGaN-based semiconductor layer, thereby forming composition gradient layers 13 and 14. COPYRIGHT : (C)2012, JPO&INPIT


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