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PLASMA ETCH REACTOR AND METHOD OF ETCHING A WAFER 发明授权

2023-07-31 4610 534K 0

专利信息

申请日期 2025-06-25 申请号 EP97903910
公开(公告)号 EP913074B1 公开(公告)日 2011-02-23
公开国别 EP 申请人省市代码 全国
申请人 OEM Group Inc
简介 A plasma etch reactor 20 includes a reactor chamber 22 with a grounded upper electrode 24, a lower electrode 28 which is attached to a high frequency power supply 30 and a low frequency power supply 32, and a peripheral electrode 26 which is located between the upper and lower electrode, and which is allowed to have a floating potential. Rare earth magnets 46, 47 are used to establish the magnetic field which confines the plasma developed within the reactor chamber 22. The plasma etch reactor 20 is capable of etching emerging films used with high density semiconductor devices.


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