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MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE 发明申请

2023-10-14 3660 325K 0

专利信息

申请日期 2026-03-23 申请号 JP2009134608
公开(公告)号 JP2010283095A 公开(公告)日 2010-12-16
公开国别 JP 申请人省市代码 全国
申请人 HITACHI LTD
简介 PROBLEM TO BE SOLVED : To provide a manufacturing method for a semiconductor device capable of preventing a resist mask from falling down by plasma treatment. SOLUTION : The manufacturing method for the semiconductor device includes a process for plasma-treating a sample having the mask of an organic material, the plasma treatment includes a first process for plasma-treating the sample with gas containing one of fluorine, oxygen and nitrogen, or all thereof, and a second process for plasma-treating the sample with gas not containing one of fluorine, oxygen and nitrogen, and containing a rare gas, and the first process and the second process are repeated in the manufacturing method for the semiconductor device. COPYRIGHT : (C)2011, JPO&INPIT


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