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FORMING METHOD OF SILICON OXIDE FILM, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE 发明申请

2023-03-13 1740 126K 0

专利信息

申请日期 2025-09-12 申请号 JP2009036750
公开(公告)号 JP2010192755A 公开(公告)日 2010-09-02
公开国别 JP 申请人省市代码 全国
申请人 TOKYO ELECTRON LTD
简介 PROBLEM TO BE SOLVED : To provide a forming method of a silicon oxide film, forming a highly insulating silicon oxide film under a low temperature. SOLUTION : The forming method of the silicon oxide film includes steps of : forming the silicon oxide film on a substrate W to be treated by supplying a silicon compound gas, an oxidizing gas, and a rare gas into a processing container 32 under the condition that the surface temperature of a holding stage 34 for holding the substrate W is 300°C or below and by generating microwave plasma in the processing container 32; and performing plasma treatment on the silicon oxide film formed on the substrate W by supplying the oxidizing gas and the rare gas into the processing container 32 and by generating microwave plasma in the processing container 32. COPYRIGHT : (C)2010, JPO&INPIT


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