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METHOD FOR FORMING SILICON OXIDE FILM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE 发明申请

2023-09-26 1940 1104K 0

专利信息

申请日期 2025-06-27 申请号 WOJP09070691
公开(公告)号 WO2010095330A1 公开(公告)日 2010-08-26
公开国别 WO 申请人省市代码 全国
申请人 TOKYO ELECTRON LIMITED; UEDA Hirokazu; OHSAWA Yusuke; TANAKA Yoshinobu
简介 A method for forming a silicon oxide film includes : a step wherein a silicon compound gas, an oxidized gas and a rare gas are supplied into a processing container (32) in a state where the surface temperature of a holding table (34), which holds a substrate to be processed (W), is kept at 300 °C or below, microwave plasma is generated in the processing container (32), and a silicon oxide film is formed on the substrate to be processed (W); and a step wherein the oxidized gas and the rare gas are supplied into the processing container (32), microwave plasma is generated in the processing container (32), and the silicon oxide film formed on the substrate to be processed (W) is processed with plasma.


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