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Resistance RAM having reactive metal layer and method for operating the same 发明授权

2023-05-25 3210 476K 0

专利信息

申请日期 2025-06-28 申请号 KR1020080033526
公开(公告)号 KR100969807B1 公开(公告)日 2010-07-05
公开国别 KR 申请人省市代码 全国
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
简介 PURPOSE : A resistance random access memory device including a reactive metal film is provided to improve a high temperature data retention property by having a uniform electrical property in case a dimension is reduced. CONSTITUTION : A resistance random access memory device includes a first electrode(11), a second electrode(17), an oxide film(13), and a reactive metal film(15). The oxide film is positioned between the first electrode and the second electrode. The reactive metal film is positioned between the oxide film and the second electrode. An electronegative degree of the reactive metal film is 1.0~1.5eV. The reactive metal film is a rare earth metal film.


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