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Process of manufacturing an N-type Schottky barrier tunnel transistor 发明授权

2023-02-16 1610 561K 0

专利信息

申请日期 2025-07-19 申请号 US11188076
公开(公告)号 US7566642B2 公开(公告)日 2009-07-28
公开国别 US 申请人省市代码 全国
申请人 Yark Yeon Kim; Moon Gyu Jang; Jae Heon Shin; Seong Jae Lee
简介 An n-type SBTT and a manufacturing method thereof are provided. The SBTT includes a silicon layer, a gate, a double layer that has a rare-earth metal silicide layer and a transition metal silicide layer. The silicon layer has a channel region. The gate is formed in an overlapping manner on the channel region and has a gate dielectric layer on its interface with respect to the silicon layer. The double layer is formed as a source/drain that has the channel region interposed on the silicon layer.


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