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CELL TESTING DEVICE AND CELL TESTING METHOD 发明申请

2023-12-08 5220 116K 0

专利信息

申请日期 2025-08-17 申请号 JP2008311323
公开(公告)号 JP2009156866A 公开(公告)日 2009-07-16
公开国别 JP 申请人省市代码 全国
申请人 NTT DOCOMO INC
简介 PROBLEM TO BE SOLVED : To provide device and method for cell testing by which any action of a damaged cell is properly verified. SOLUTION : Previously, no action of damaged cell could properly have been verified because full crush condition of the cell is an extremely rare case under the status of using a portable device such as a cellular phone, and further because this full crush condition of the cell does not mean the worst-case condition in abnormality determination resulted from internal short-circuit, etc. Therefore, a use thrust member partially crushes secondary cell 2 mounted on test stand 3 and then measure temperature of the secondary cell 2 to determine quality level of the cell 2, enabling proper verification of its action if the cell 2 is damaged. COPYRIGHT : (C)2009, JPO&INPIT


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