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NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME 发明申请

2023-02-14 2110 726K 0

专利信息

申请日期 2025-08-01 申请号 KR1020070120745
公开(公告)号 KR1020080047996A 公开(公告)日 2008-05-30
公开国别 KR 申请人省市代码 全国
申请人 KABUSHIKI KAISHA TOSHIBA
简介 PURPOSE : A non-volatile semiconductor memory device and a manufacturing method thereof are provided to solve a crystallization problem caused when a rare earth oxide is used as an inter-electrode dielectric or a blocking dielectric. CONSTITUTION : A non-volatile semiconductor memory device includes a tunnel insulating layer, a floating gate electrode, an interface opposite to the floating gate electrode, an inter-electrode dielectric(12) defining the interface into a first interface and a second interface, and a control gate electrode. The inter-electrode dielectric includes first elements selected from rare earth elements, second elements selected from the group consisting of Al, Ti, Zr, Hf, Ta, Mg, Ca, Sr and Ba, and oxygen. A composition ratio of the first elements is varied between the first interface and the second interface. A composition ratio of the first elements around the first interface is lower that of the first elements around the second interface. © KIPO 2008


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