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OXIDE SEMICONDUCTOR, AND THIN FILM TRANSISTOR HAVING THE SAME AND ITS MANUFACTURING METHOD 发明申请

2022-12-30 2180 83K 0

专利信息

申请日期 2025-06-24 申请号 JP2008175404
公开(公告)号 JP2009016844A 公开(公告)日 2009-01-22
公开国别 JP 申请人省市代码 全国
申请人 SAMSUNG ELECTRONICS CO LTD
简介 PROBLEM TO BE SOLVED : To provide an oxide semiconductor containing GaxInyZnz oxide and a new material, and to provide a thin film transistor whose property is improved by adding the GaxInyZnz oxide and the new material as the channels of the thin film transistor, and its manufacturing method. SOLUTION : The oxide semiconductor contains the GaxInyZnz oxide, and at least one material selected from groups consisting of a 4A-group material, oxide of the 4A-group material and a rare earth material. COPYRIGHT : (C)2009, JPO&INPIT


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