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Oxide semiconductor, Thin Film Transistor comprising the same and Manufacturing method 发明申请

2023-10-31 1190 504K 0

专利信息

申请日期 2025-06-24 申请号 KR1020070067131
公开(公告)号 KR1020090002841A 公开(公告)日 2009-01-09
公开国别 KR 申请人省市代码 全国
申请人 SAMSUNG ELECTRONICS CO LTD
简介 PURPOSE : The oxide semiconductor, and thin film transistor including the same and manufacturing method thereof are provided to use the channel of the single layered or multi-layered structure as GaxInyZnz oxide.CONSTITUTION : The thin film transistor comprises the substrate(11) having the insulating layer(12), the gate isolation layer(14), the channel(15), and the souce and drain(16b). The channel is oxide semiconductor including 4A family material in the GaxInyZnz oxide semiconductor material, and 4A family oxide or the rare earth material. The 4A family material is one among Ti, and Zr or Hf. The oxide semiconductor is the TiInZn oxide or the TiGaInZn oxide.© KIPO 2009


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