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Method for manufacturing semiconductor device 发明授权

2023-09-09 2720 242K 0

专利信息

申请日期 2026-03-11 申请号 JP2002086968
公开(公告)号 JP4176366B2 公开(公告)日 2008-11-05
公开国别 JP 申请人省市代码 全国
申请人 Semiconductor Energy Laboratory Co Ltd153878
简介 PROBLEM TO BE SOLVED : To enhance the orientation rate of a semiconductor film obtained by crystallizing an amorphous semiconductor film while relaxing strain, and to provide a TFT employing such a crystalline semiconductor film. SOLUTION : The orientation rate of a semiconductor film 104 is enhanced by adding a rare gas element, typically argon, into an amorphous semiconductor film 102 during or after formation thereof thereby crystallizing the amorphous semiconductor film, and strain existing in the crystallized semiconductor film 104 is relaxed as compared with that before crystallization. The film is eventually irradiated with laser light in order to remove rare gas elements.


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