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SCHOTTKY BARRIER TUNNEL TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME 发明授权

2023-03-12 3530 281K 0

专利信息

申请日期 2025-09-11 申请号 KR1020060118986
公开(公告)号 KR100770012B1 公开(公告)日 2007-10-18
公开国别 KR 申请人省市代码 全国
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
简介 PURPOSE : A schottky barrier tunnel transistor and a method of manufacturing the same are provided to obtain a thin gate insulating layer easily and to prevent the decrease of a saturated current due to a parasitic resistance by forming a gate electrode, a source region and a drain region like a schottky junction structure using a silicide layer. CONSTITUTION : A gate electrode(113) is formed on a channel region of a silicon substrate in order to form a schottky junction together with the silicon substrate. Source and drain regions(115) are formed in the silicon substrate through both sides of the gate electrode. The gate electrode is composed of a metal film made of a transitional metal or a rare metal. The gate electrode is composed of a metal silicide layer. The source and drain regions are made of the metal silicide layer. © KIPO 2008


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