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Rare earth element-doped silicon/silicon dioxide lattice structure 发明授权

2023-09-05 1020 616K 0

专利信息

申请日期 2025-07-18 申请号 US11039463
公开(公告)号 US7256426B2 公开(公告)日 2007-08-14
公开国别 US 申请人省市代码 全国
申请人 Tingkai Li; Wei Gao; Yoshi Ono; Sheng Teng Hsu
简介 Provided are an electroluminescence (EL) device and corresponding method for forming a rare earth element-doped silicon (Si)/Si dioxide (SiO2) lattice structure. The method comprises : providing a substrate; DC sputtering a layer of amorphous Si overlying the substrate; DC sputtering a rare earth element; in response, doping the Si layer with the rare earth element; DC sputtering a layer of SiO2 overlying the rare earth-doped Si; forming a lattice structure; annealing; and, in response to the annealing, forming nanocrystals in the rare-earth doped Si having a grain size in the range of 1 to 5 nanometers (nm). In one aspect, the rare earth element and Si are co-DC sputtered. Typically, the steps of DC sputtering Si, DC sputtering the rare earth element, and DC sputtering the SiO2 are repeated 5 to 60 cycles, so that the lattice structure includes the plurality (5-60) of alternating SiO2 and rare earth element-doped Si layers.


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