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STRESS MEASURING METHOD AND DEVICE, AND QUALITY CONTROL METHOD 发明申请

2023-06-22 4340 108K 0

专利信息

申请日期 2025-07-03 申请号 JP2005318311
公开(公告)号 JP2007127435A 公开(公告)日 2007-05-24
公开国别 JP 申请人省市代码 全国
申请人 TAIYO YUDEN KK
简介 PROBLEM TO BE SOLVED : To nondestructively measure a stress of a measuring object. SOLUTION : The measuring object including a rare earth element is irradiated with a laser or an electron beam, and the quantity of a peak wavenumber of a generated fluorescent spectrum, shifted by a stress is measured, to thereby measure the stress. The direction is adjusted by rocking the measuring object so that the peak intensity of the irregular fluorescent spectrum of the measuring object is stabilized as high as possible. Hereby, a stress or a strain of a product, or a member or an element constituting the product or the like can nondestructively be measured without being affected by the shape, the kind or the like of the measuring object. Since fluorescence emitted from the rare earth element is utilized, it is applicable even to a solid material formed at a high temperature such as ceramics without being denaturalized at a high temperature. COPYRIGHT : (C)2007, JPO&INPIT


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