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EVALUATION METHOD FOR BISMUTH-SUBSTITUTED RARE-EARTH IRON GARNET MEMBRANE CHIP 发明申请

2023-05-20 1980 55K 0

专利信息

申请日期 2025-07-12 申请号 JP2005216950
公开(公告)号 JP2007033234A 公开(公告)日 2007-02-08
公开国别 JP 申请人省市代码 全国
申请人 GRANOPT LTD
简介 PROBLEM TO BE SOLVED : To provide a method with an easy process for evaluating quality of bismuth-substituted rare-earth iron garnet membrane chip obtained by cutting bismuth-substituted rare-earth iron garnet membrane of which the magnetically saturated state is maintained without any exterior magnetic field, into small chips. SOLUTION : The evaluation method is for bismuth-substituted rare-earth iron garnet membrane obtained by cutting a wafer 1 of the bismuth-substituted rare-earth iron garnet membrane into small chips. After obtaining the chips of bismuth-substituted rare-earth iron garnet membrane by cutting into small chips, the magnetized bismuth-substituted rare-earth iron garnet membrane, a magnetic field, which is smaller than the coercive force that the bismuth-substituted rare-earth iron garnet membrane originally has, is impressed in reverse direction to the magnetized direction to the chip. Then, quality of the chip is judged by microscope observation. COPYRIGHT : (C)2007, JPO&INPIT


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