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Method for treating a semiconductor surface to form a metal-containing layer 发明授权

2023-03-14 1250 611K 0

专利信息

申请日期 2025-09-14 申请号 US10865268
公开(公告)号 US7132360B2 公开(公告)日 2006-11-07
公开国别 US 申请人省市代码 全国
申请人 James K Schaeffer; Darrell Roan; Dina H Triyoso; Olubunmi O Adetutu
简介 A method for treating a semiconductor surface to form a metal-containing layer includes providing a semiconductor substrate having an exposed surface. The exposed surface of the semiconductor substrate is treated by forming one or more metals overlying the semiconductor substrate but not completely covering the exposed surface of the semiconductor substrate. The one or more metals enhance nucleation for subsequent material growth. A metal-containing layer is formed on the exposed surface of the semiconductor substrate that has been treated. The treatment of the exposed surface of the semiconductor substrate assists the metal-containing layer to coalesce. In one embodiment, treatment of the exposed surface to enhance nucleation may be performed by spin-coating, atomic layer deposition (ALD), physical layer deposition (PVD), electroplating, or electroless plating. The one or more metals used to treat the exposed surface may include any rare earth or transition metal, such as, for example, hafnium, lanthanum, etc.


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