| 简介 |
Method for fabricating the structure of an electronic device (e.g. a high-performance MOS semiconductor device) having good electric characteristics in which an SiO2 film and an SiON film are employed as an insulation film having an extremely small thickness (e.g. 2.5 nm or less) and polysilicon, amorphous silicon or SiGe is employed for an electrode. Under existence of a processing gas containing oxygen and a rare gas, a wafer W principally comprising Si is irradiated with microwave through a planar antenna member SPA to form a plasma containing oxygen and a rare gas (or a plasma containing nitrogen and a rare gas or a plasma containing nitrogen, a rare gas and hydrogen). An oxide film (or an oxide nitride film) is formed on the wafer surface using that plasma and an electrode of polysilicon, amorphous silicon or SiGe is formed, as required, thus forming the structure of an electronic device.
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