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SURFACE TREATMENT APPARATUS, THIN FILM FORMING APPARATUS, SURFACE TREATMENT METHOD AND METHOD FOR 发明申请

2023-09-21 1730 113K 0

专利信息

申请日期 2025-07-08 申请号 JP2004189235
公开(公告)号 JP2006009106A 公开(公告)日 2006-01-12
公开国别 JP 申请人省市代码 全国
申请人 MITSUBISHI HEAVY IND LTD
简介 PROBLEM TO BE SOLVED : To provide a thin film forming apparatus which eliminates influences of Cl without carrying out a post treatment process and which prevents formation of an impurity layer or the like. SOLUTION : After a Cu thin film is formed, supply of Cl2 gas 21 is stopped as well as Ar gas 22 is supplied through a gas nozzle 18 to generate Ar* so as to substitute Ar* for Cl* remaining after the film of a Cu component is formed on a substrate 3. Thereby, formation of a contaminated layer of particles due to re-reaction of residual Cl* is suppressed, the surface of the Cu layer is kept clean and the surface of a member 11 to be etched is kept clean. COPYRIGHT : (C)2006, JPO&NCIPI


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