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Method for treating a semiconductor surface to form a metal-containing layer 发明申请

2023-01-07 4720 581K 0

专利信息

申请日期 2026-04-24 申请号 US10865268
公开(公告)号 US20050277294A1 公开(公告)日 2005-12-15
公开国别 US 申请人省市代码 全国
申请人 SCHAEFFER JAMES K; ROAN DARRELL; TRIYOSO DINA H; ADETUTU OLUBUNMI O
简介 A method for treating a semiconductor surface to form a metal-containing layer includes providing a semiconductor substrate having an exposed surface. The exposed surface of the semiconductor substrate is treated by forming one or more metals overlying the semiconductor substrate but not completely covering the exposed surface of the semiconductor substrate. The one or more metals enhance nucleation for subsequent material growth. A metal-containing layer is formed on the exposed surface of the semiconductor substrate that has been treated. The treatment of the exposed surface of the semiconductor substrate assists the metal-containing layer to coalesce. In one embodiment, treatment of the exposed surface to enhance nucleation may be performed by spin-coating, atomic layer deposition (ALD), physical layer deposition (PVD), electroplating, or electroless plating. The one or more metals used to treat the exposed surface may include any rare earth or transition metal, such as, for example, hafnium, lanthanum, etc.


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