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SPUTTERING METHOD 发明申请

2023-04-14 4650 67K 0

专利信息

申请日期 2025-09-18 申请号 JP2004057221
公开(公告)号 JP2005248222A 公开(公告)日 2005-09-15
公开国别 JP 申请人省市代码 全国
申请人 MATSUSHITA ELECTRIC IND CO LTD
简介 PROBLEM TO BE SOLVED : To provide a sputtering method capable of ensuring film thickness uniformity in an extensive range without considerably degrading the target utilization efficiency by using a compact target of the diameter of ≤ 2 inches. SOLUTION : In the sputtering method, a target of the diameter of ≤ 2 inches is arranged facing an electrode in a vacuum container, plasma is generated in the vacuum container by applying the high frequency power to the electrode while introducing at least one of rare gas and reactive gas in the vacuum container, and a substrate arranged on the electrode is treated. The molecular weight of at least one of rare gas and reactive gas is larger than that of the element of the largest atomic weight out of the elements to constitute the target.


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