客服热线:18202992950

ANALYZING METHOD AND ITS DEVICE FOR IMPURITY IN MIXED GAS 发明申请

2023-11-20 3960 154K 0

专利信息

申请日期 2026-04-24 申请号 JP2004059504
公开(公告)号 JP2005249551A 公开(公告)日 2005-09-15
公开国别 JP 申请人省市代码 全国
申请人 TAIYO NIPPON SANSO CORP
简介 PROBLEM TO BE SOLVED : To provide an analyzing method and its device for impurity in mixed gas, to highly accurately and continuously measure impurity components included in a mixed gas of a relatively large amount of oxygen with a rare gas, the oxygen having ionization potential lower than that of an impurity component being a measuring object. SOLUTION : The mixed gas mainly composed of the rare gas and oxygen is introduced at a pressure lower than the atmospheric pressure into a discharge tube 12 with its electrode impressed with an AC voltage. Light specific to an impurity included in the mixed gas is extracted from light generated by electric discharge in the discharge tube to detect its light emission intensity, while measuring rare gas concentration in the mixed gas or oxygen concentration. The detected emission intensity is corrected correspondent to the measured rare gas concentration or oxygen concentration to calculate impurity concentration.


您还没有登录,请登录后查看下载地址


反对 0举报 0 收藏 0 打赏 0评论 0
下载排行
网站首页  |  关于我们  |  联系方式  |  使用协议  |  版权隐私  |  网站地图  |  排名推广  |  广告服务  |  积分换礼  |  网站留言  |  RSS订阅  |  违规举报  |  京ICP备2021025988号-4